IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8244ANTG4 is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN TEST DEVICE BUFF 24-DIP. Key specifications: mounting type Through Hole, operating temperature 0°C ~ 70°C, supply voltage 4.5V ~ 5.5V, package / case 24-DIP (0.300", 7.62mm).
In Stock: 1,673
| Attribute | Value |
|---|---|
| Product Status | Obsolete |
| Logic Type | Scan Test Device with Buffers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP |
SN74BCT8244ANTG4 is Obsolete. Consider these compatible alternatives:
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 100% | View |
| SN74BCT29854NT | Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 100% | View |
| SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 100% | View |
| N74F656AN,602 | NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 100% | View |
| AM2960PC | Advanced Micro Devices | ERROR DETECTION & CORRECTION | 77% | View |
| SN74S1051N | Texas Instruments | IC 12-BIT BUS TERM ARRAY16-DIP | 75% | View |
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