IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8240ANT is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN TEST DEVICE BUFF 24-DIP. Key specifications: mounting type Through Hole, operating temperature 0°C ~ 70°C, supply voltage 4.5V ~ 5.5V, package / case 24-DIP (0.300", 7.62mm).
In Stock: 1,404
| Attribute | Value |
|---|---|
| Product Status | Obsolete |
| Logic Type | Scan Test Device with Inverting Buffers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP |
SN74BCT8240ANT is Obsolete. Consider these compatible alternatives:
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 100% | View |
| SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 100% | View |
| SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 100% | View |
| SN74BCT29854NT | Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 100% | View |
| SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 100% | View |
| AM2954DC | Advanced Micro Devices | BUS DRIVER, S SERIES, 8-BIT | 98% | View |
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3J LIMITED
