IC SCAN TEST DEVICE LATCH 24SOIC
SN74BCT8373ADWR is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN TEST DEVICE LATCH 24SOIC. Key specifications: mounting type Surface Mount, operating temperature 0°C ~ 70°C, supply voltage 4.5V ~ 5.5V, package / case 24-SOIC (0.295", 7.50mm Width).
In Stock: 32,973
| Attribute | Value |
|---|---|
| Product Status | Obsolete |
| Logic Type | Scan Test Device with D-Type Latches |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
SN74BCT8373ADWR is Obsolete. Consider these compatible alternatives:
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74ABT8952DL | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 100% | View |
| SN74BCT29854DW | Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 100% | View |
| SN74ABT8646DLR | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 100% | View |
| SN74ABT8543DW | Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 100% | View |
| SN74ABT8952DW | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 100% | View |
| SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 100% | View |
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