IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADW is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN TEST DEVICE TXRX 24-SOIC. Key specifications: mounting type Surface Mount, operating temperature 0°C ~ 70°C, supply voltage 4.5V ~ 5.5V, package / case 24-SOIC (0.295", 7.50mm Width).
In Stock: 6,796
| Attribute | Value |
|---|---|
| Product Status | Active |
| Logic Type | Scan Test Device with Bus Transceivers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74F1056DR | Texas Instruments | IC ARRAY BUS-TERM 8BIT 16-SOIC | 100% | View |
| SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 100% | View |
| SN74ABT8652DW | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 100% | View |
| SN74ABT8245DWR | Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 100% | View |
| SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 100% | View |
| SN74GTLP22033DGGR | Texas Instruments | IC REG TXRX LVTTL-GTLP 48-TSSOP | 89% | View |
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