IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8240ADWR is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN TEST DEVICE BUFF 24-SOIC. Key specifications: mounting type Surface Mount, operating temperature 0°C ~ 70°C, supply voltage 4.5V ~ 5.5V, package / case 24-SOIC (0.295", 7.50mm Width).
In Stock: 30,000
| Attribute | Value |
|---|---|
| Product Status | Obsolete |
| Logic Type | Scan Test Device with Inverting Buffers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Surface Mount |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 24-SOIC |
SN74BCT8240ADWR is Obsolete. Consider these compatible alternatives:
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|---|---|---|---|---|
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3J LIMITED
