IC SCAN-TEST-DEV/TXRX 64-LQFP
SN74ABTH18646APM is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN-TEST-DEV/TXRX 64-LQFP. Key specifications: mounting type Surface Mount, operating temperature -40°C ~ 85°C, supply voltage 4.5V ~ 5.5V, package / case 64-LQFP.
In Stock: 2,844
| Attribute | Value |
|---|---|
| Product Status | Active |
| Logic Type | Scan Test Device With Transceivers And Registers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 18 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 64-LQFP |
| Supplier Device Package | 64-LQFP (10x10) |
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74ABT18502PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 100% | View |
| CY74FCT162823ETPVC | Rochester Electronics, LLC | BUS DRIVER, FCT SERIES, 2 FUNC, | 100% | View |
| SN74ABTH18652APM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 100% | View |
| SN74ACT1073DWR | Texas Instruments | IC 16BIT BUS-TERM ARRAY 20-SOIC | 96% | View |
| SN74ACT1073NSR | Texas Instruments | IC 16BIT BUS-TERM ARRAY 20SO | 96% | View |
| AM2960/BZA | Advanced Micro Devices | 8760201ZA) | 96% | View |
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