IC SCAN-TEST-DEV/XCVR 28-SOIC
SN74ABT8646DW is a Logic - Specialty Logic manufactured by Texas Instruments. IC SCAN-TEST-DEV/XCVR 28-SOIC. Key specifications: mounting type Surface Mount, operating temperature -40°C ~ 85°C, supply voltage 4.5V ~ 5.5V, package / case 28-SOIC (0.295", 7.50mm Width).
In Stock: 5,867
| Attribute | Value |
|---|---|
| Product Status | Active |
| Logic Type | Scan Test Device with Bus Transceiver and Registers |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 28-SOIC (0.295", 7.50mm Width) |
| Supplier Device Package | 28-SOIC |
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74ABT8952DL | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 100% | View |
| SN74ABT8543DL | Texas Instruments | IC SCAN TEST DEV/TXRX 28-SSOP | 100% | View |
| SN74ABT8652DWR | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 100% | View |
| 74VHC161284MTD | Fairchild Semiconductor | LINE TRANSCEIVER | 100% | View |
| SN74GTLP2033DGGR | Texas Instruments | IC REG XCVR LVTTL-GTLP 48-TSSOP | 89% | View |
| SN74LVT8980AIDWREP | Texas Instruments | IC EMBEDDED TEST BUS CTRL 24SOIC | 84% | View |
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