IC ABT SCAN TEST DEV3.3V 64TSSOP
8V182512IDGGREP is a Logic - Specialty Logic manufactured by Texas Instruments. IC ABT SCAN TEST DEV3.3V 64TSSOP. Key specifications: mounting type Surface Mount, operating temperature -40°C ~ 85°C, supply voltage 2.7V ~ 3.6V, package / case 64-TFSOP (0.240", 6.10mm Width).
In Stock: 8,772
| Attribute | Value |
|---|---|
| Product Status | Active |
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Supply Voltage | 2.7V ~ 3.6V |
| Number of Bits | 18 |
| Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount |
| Package / Case | 64-TFSOP (0.240", 6.10mm Width) |
| Supplier Device Package | 64-TSSOP |
| Part Number | Manufacturer | Description | Match | |
|---|---|---|---|---|
| SN74LVTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 100% | View |
| SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 100% | View |
| SN74LVTH182512DGGR | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | 100% | View |
| SN74ABTH182652APM | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 84% | View |
| SN74ABT18652PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 84% | View |
| SN74ABT18245ADGGR | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 84% | View |
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